Tuesday & Wednesday, June 5 & 6, 2018
The workshop provides an overview and critical comparison of major analytical techniques for materials characterization with emphasis on practical applications on various fields of Engineering, Physics, Chemistry, etc. Presentations and instrument demonstrations will span from basic to advanced topics suitable to both novice and experienced scientists. Several walkthrough examples will focus on problem-solving strategies, instrumental resolution requirements and potential artifacts on data collection and interpretation.
- Atomic force microscopy (AFM) and nanoindentation.
- Focused ion beam (FIB) for sample preparation and nanofabrication.
- Scanning and electron microscopy (SEM, TEM, STEM) including energy dispersive x-ray spectroscopy (EDS) and electron energy-loss spectroscopy (EELS).
- Ellipsometry, FTIR, Raman, photoluminescence, confocal microscopy and spectroscopy in general.
- X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES).
- Secondary ion mass spectroscopy (SIMS) and Rutherford backscattering spectroscopy (RBS).
- X-ray diffraction (XRD), reflectivity (XRR), fluorescence (XRF) and small-angle x-ray scattering (SAXS).
- Differential scanning calorimetry (DSC), differential thermal analysis (DTA), particle size analysis, thermogravimetric analysis (TGA).
- Special session on polymers and soft materials, including microscopy of biological specimens.
- MRL staff scientists with 20+ years of hands-on experience in materials characterization.
- Industrial scientists introducing new technology and new instrumentation.
- Vendors exhibit show with live instrument demos and scientists on-site discussing advanced applications.
- Several networking opportunities including evening reception, breaks and lunches.
- Tours of the MRL laboratories.
Only $75 per person including breakfast and lunch for both days, and evening reception on the first day.
Click here to register.
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